The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Aug. 31, 2017
Facebook Technologies, Llc, Menlo Park, CA (US);
Andrew Matthew Bardagjy, Fremont, CA (US);
Joseph Duggan, San Francisco, CA (US);
Cina Hazegh, Walnut, CA (US);
Fei Liu, San Jose, CA (US);
Mark Timothy Sullivan, Mountain View, CA (US);
Simon Morris Shand Weiss, Redwood City, CA (US);
Facebook Technologies, LLC, Menlo Park, CA (US);
Abstract
A depth measurement assembly (DMA) measures depth information of an object in a local area. The DMA includes structured light projector, a depth camera assembly, and a controller. The structured light projector projects structured light patterns into the local area. The structured light projector includes a diffractive optical unit that includes diffractive optical elements (DOEs) and selects a DOE. The selected DOE is illuminated by light from a light source and converts the light into a structured light pattern. In some embodiment, the diffractive optical units selects multiple DOEs associated with multiple structured light patterns. The structured light pattern is projected into the local area by a projection assembly of the structured light projector and illuminates the object. The depth camera assembly captures images of the object. The controller uses the captured images to determine depth information of the object.