The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Sep. 12, 2017
Applicant:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Inventor:
Kazunori Harada, Kawasaki, JP;
Assignee:
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01Q 10/04 (2010.01); G01Q 60/30 (2010.01);
U.S. Cl.
CPC ...
G01Q 10/04 (2013.01);
Abstract
A conductive probe includes a protruding portion provided on an elastic member, a conductive metal film covering at least a tip of the protruding portion; and an insulating thin film covering the conductive metal film provided on the tip of the protruding portion.
Harada, Kazunori. (2019). Conductive probe, electrical property evaluating system, scanning probe microscope, conductive probe manufacturing method, and electrical property measuring method (U.S. Patent No. 10466270). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10466270
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile