The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Apr. 23, 2012
Toon Hendrik Evers, Eindhoven, NL;
Derk Jan Wilfred Klunder, Geldrop, NL;
Jeroen Hans Nieuwenhuis, Waalre, NL;
Joannes Baptist Adrianus Dionisius Van Zon, Waalre, NL;
Toon Hendrik Evers, Eindhoven, NL;
Derk Jan Wilfred Klunder, Geldrop, NL;
Jeroen Hans Nieuwenhuis, Waalre, NL;
Joannes Baptist Adrianus Dionisius Van Zon, Waalre, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
During an assay, optical measurements are made at a sensing surface (), and at least one 'homogeneity-image' of the sensing surface () is generated. From this image, an 'homogeneity-indicator' is determined for at least one region of interest, and the optical measurements are then evaluated in dependence on said indicator. The homogeneity-indicator may for example be a binary value which indicates if an inhomogeneity was detected or not. If an inhomogeneity was detected, all optical measurements may be rejected, only measurements for the involved region of interest may be rejected, or measurements for a selected sub-area of the involved region of interest (ROI) may be rejected.