The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Jul. 13, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tomoaki Hiruta, Santa Clara, CA (US);

Chetan Gupta, Santa Clara, CA (US);

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 17/02 (2006.01); G06F 17/18 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01M 99/008 (2013.01); G05B 17/02 (2013.01); G05B 23/0254 (2013.01); G06F 17/18 (2013.01); G05B 23/0221 (2013.01);
Abstract

In some examples, a computing device may generate simulated data based on a physical model of equipment. For example, the simulated data may include a plurality of probability distributions of a plurality of degrees of failure, respectively, for at least one failure mode of the equipment. In addition, the computing device may receive sensor data indicating a measured metric of the equipment. The computing device may compare the received sensor data with the simulated data to determine a failure mode and a degree of failure of the equipment. At least partially based on the determined failure mode and degree of failure of the equipment, the computing device may send at least one of a notification or a control signal.


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