The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Dec. 13, 2018
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Da Pan, Jersey City, NJ (US);

Yue Tian, Princeton, NJ (US);

Ming-Fang Huang, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/433 (2006.01); G01N 21/39 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/433 (2013.01); G01J 3/4338 (2013.01); G01N 21/274 (2013.01); G01N 21/39 (2013.01); G01N 2021/399 (2013.01); G01N 2201/127 (2013.01);
Abstract

A computer-implemented method for measuring gas concentration from a 2f signal in wavelength modulation spectroscopy is presented. The computer-implemented method includes emitting a beam of light from a laser to pass through a gas sample, calculating a gas measurement value from the gas sample via a trough distance calculator using a trough distance of a gas absorption line's 2f signal, calibrating the gas measurement value via a multi-point calibration process, and outputting the gas measurement value to a user interface of a computing device.


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