The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Aug. 21, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Hideaki Kasahara, Matsumoto, JP;

Masashi Kanai, Azumino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/45 (2006.01); G01J 3/51 (2006.01); G01J 3/52 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01J 3/027 (2013.01); G01J 3/2823 (2013.01); G01J 3/45 (2013.01); G01J 3/51 (2013.01); G01J 3/524 (2013.01);
Abstract

A spectroscopic camera includes a wavelength variable interference filter, and an image sensor that receives light which is transmitted through the wavelength variable interference filter. Measurement is implemented a plurality of times by causing measurement light to be incident to the wavelength variable interference filter and changing the wavelength of light that is transmitted by the wavelength variable interference filter. Reflectance based on the intensity of light when a first pixel of the image sensor receives light of a target wavelength, is predicted in the respective plurality of repetitions of measurement on the basis of a light reception central wavelength of light that the first pixel receives, and reflectance that is calculated on the basis of the intensity of light that is received by the first pixel.


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