The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Sep. 28, 2018
Applicant:

Coretech System Co., Ltd., Chupei, Hsinchu County, TW;

Inventors:

Yuing Chang, Chupei, TW;

Rong-Yeu Chang, Chupei, TW;

De-Lung Lai, Chupei, TW;

Chia-Hsiang Hsu, Chupei, TW;

Assignee:

CORETECH SYSTEM CO., LTD., Chupei, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 22/02 (2006.01); G01N 9/02 (2006.01); G01N 33/44 (2006.01);
U.S. Cl.
CPC ...
G01F 22/02 (2013.01); G01N 9/02 (2013.01); G01N 33/442 (2013.01);
Abstract

The present disclosure provides a measuring apparatus including a testing module. The testing module includes: a temperature-controlling cylinder having a top opening and a bottom opening; an upper piston and a lower piston respectively seal the top opening and the bottom opening of the temperature-controlling cylinder so that a testing chamber is formed inside the temperature-controlling cylinder, wherein the testing chamber has a longitudinal length; and a pipe surrounding the testing chamber along the longitudinal length in such a way that when a wire is provided along and in the pipe with a number of turns, a density of the turns has at least two different values over the longitudinal length.


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