The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

May. 25, 2017
Applicant:

Baumer Electric Ag, Frauenfeld, CH;

Inventors:

Klaus Friedrich Müller, Heidelberg, DE;

Sven Bauer, Kreuzlingen, CH;

Assignee:

BAUMER ELECTRIC AG, Frauenfeld, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01S 17/00 (2006.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01); G01M 17/02 (2006.01); G01S 17/08 (2006.01); G01B 11/06 (2006.01); G01B 11/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/0608 (2013.01); G01B 11/22 (2013.01); G01B 11/303 (2013.01); G01M 17/027 (2013.01); G01S 17/08 (2013.01);
Abstract

A sensor device (), for measuring a surface (), includes a lighting device () emitting a light beam (); an optical device () splitting the light beam () into partial light beams (), and emitting the first partial light beam () toward a first surface area () and emitting the second partial light beam () toward a second surface area (). A light sensor () is configured to receive a first surface area reflection (-) of the first partial light beam () and a second surface area reflection (-) of the second partial light beam (). A processor () is configured to detect a distance of the first surface area () and of the second surface area () to the sensor device () based on a position of the first partial light beam reflection (-) and the second partial light beam reflection (-) on the light sensor ().


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