The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Mar. 28, 2016
Applicants:

Beijing Jingdong Shangke Information Technology Co., Ltd., Haidian District, Beijing, CN;

Beijing Jingdong Century Trading Co., Ltd., Beijing, CN;

Inventors:

Gang Zhao, Beijing, CN;

Peng Qiu, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/22 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01B 11/22 (2013.01);
Abstract

An apparatus, method and device for measuring the size of an object, comprising a depth sensor (), a sensor bracket (), a correction assistance apparatus (), an object placement platform () and a computer (). The correction assistance apparatus () is used for assisting in the correction of a plane of the depth sensor (), comprises a fabric or a printing substance having black-and-white chessboard textures, and comprises a transparent flat plate, the fabric or the printing substance being laid on the object placement platform (), and the transparent flat plate being pressed against the fabric or the printing substance. The depth sensor () is disposed on the sensor bracket () and is located in a space above the object placement platform (). The computer () is connected to the depth sensor (). The device and the method contribute to efficient and accurate calculation of the size of an object.


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