The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
May. 12, 2017
Applicant:
Auburn University, Auburn, AL (US);
Inventors:
Austin R. Gurley, Leeds, AL (US);
David G. Beale, Auburn, AL (US);
Royall M. Broughton, Auburn, AL (US);
Assignee:
Auburn University, Auburn, AL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); G01D 5/353 (2006.01); G01D 5/347 (2006.01); G01D 5/26 (2006.01); G01D 5/12 (2006.01); H03M 1/28 (2006.01); G01B 11/06 (2006.01); G01D 5/16 (2006.01); G01B 7/02 (2006.01);
U.S. Cl.
CPC ...
G01B 7/14 (2013.01); G01B 7/02 (2013.01); G01B 11/0608 (2013.01); G01D 5/12 (2013.01); G01D 5/16 (2013.01); G01D 5/266 (2013.01); G01D 5/347 (2013.01); G01D 5/35383 (2013.01); H03M 1/282 (2013.01);
Abstract
A method for determining a length of a span of electrically conductive material, comprising a first voltage measurement across the entire span, and a second voltage measurement across a constant-length segment of the span. The dual measurements allow the calculation of the span length in a manner that is robust to many disturbances including ambient temperature, material temperature, and material stress and fatigue.