The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Jul. 19, 2017
Applicant:
Fotonation Limited, Galway, IE;
Inventors:
Hossein Javidnia, Galway, IE;
Peter Corcoran, Claregalway, IE;
Assignee:
FotoNation Limited, Galway, IE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 13/128 (2018.01); G06T 5/20 (2006.01); G06T 7/593 (2017.01); H04N 13/257 (2018.01); H04N 13/271 (2018.01); H04N 13/239 (2018.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/128 (2018.05); G06K 9/4604 (2013.01); G06K 9/6212 (2013.01); G06T 5/20 (2013.01); G06T 7/593 (2017.01); H04N 13/239 (2018.05); H04N 13/257 (2018.05); H04N 13/271 (2018.05); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20032 (2013.01); G06T 2207/30256 (2013.01); G06T 2207/30261 (2013.01); H04N 2013/0081 (2013.01);
Abstract
A method for improving accuracy of depth map information derived from image data descriptive of a scene. In one embodiment Mutual Feature Map data are created based on initial disparity map data values and the image data descriptive of the scene. The Mutual Feature Map data are applied to create a series of weighting functions representing structural details that can be transferred to the first disparity values to restore degraded features or replace some of the first disparity values with values more representative of structural features present in the image data descriptive of the scene.