The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Sep. 13, 2016
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Veerasekhar Addepalli, Levittown, PA (US);

Ajinkya Atul Bokil, Hamilton Township, NJ (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/08 (2006.01); G06F 16/958 (2019.01);
U.S. Cl.
CPC ...
H04L 67/22 (2013.01); G06F 16/958 (2019.01); H04L 67/02 (2013.01);
Abstract

A web service tagging tool including a memory operable to store logging tags and a web service application. The web service application includes a tagging engine configured to send data content comprising one or more logging tags for a user interface of a user application. Each logging tag is linked to an element of the user interface that comprises a hyperlink and location information identifying a location of the element in the user application. The web service application further includes a data collection engine configured to receive data for the element linked with the one or more logging tags and aggregate the received data for each of the one or more logging tags. The web service application further includes a metric overlay engine configured to generate overlay data for an overlay mapping the aggregated data to elements of the user interface and send the overlay data to the user application.


Find Patent Forward Citations

Addepalli, Veerasekhar. (2019). Interprogram communication with event handling for metric overlays (U.S. Patent No. 10462241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10462241

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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