The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Aug. 08, 2016
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Julien Freudiger, Mountain View, CA (US);
Shantanu Rane, Menlo Park, CA (US);
Alejandro E. Brito, Mountain View, CA (US);
Ersin Uzun, Campbell, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A computer-implemented system and method for analyzing data quality is provided. Attributes each associated with one or more elements are maintained. A request from a user is received for determining data quality of at least one attribute based on an interest vector having a listing of the elements of that attribute and a selection of elements of interest. Each element is encrypted. A condensed vector having the same listing of elements as the interest vector is populated with occurrence frequencies for each of the listed elements. The elements of the condensed vector are encrypted by computing an encrypted product of each element in the condensed vector and the corresponding element of the interest vector. An aggregate is determined based on the encrypted products of each element of the interest vector and the corresponding element of the condensed vector. The aggregate is provided as results of the data quality.