The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Jun. 01, 2017
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventor:

Carl H. Alelyunas, Austin, TX (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H04L 5/00 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 25/025 (2013.01); H04L 5/0048 (2013.01); H04L 27/261 (2013.01); H04L 5/0007 (2013.01); H04L 27/2647 (2013.01);
Abstract

A method includes generating a two-dimensionally filtered pilot tone based on a plurality of received pilot tones received using a first subcarrier of each of a plurality of received OFDM symbols and a plurality of data symbols received using a second subcarrier of each of the plurality of received OFDM symbols. The plurality of OFDM symbols is received sequentially over a plurality of OFDM symbol times. The method may include generating inverse channel coefficients based on the two-dimensionally filtered pilot tone. The method may include applying the inverse channel coefficients to a subsequently received OFDM symbol to recover data encoded in the subsequently received OFDM symbol. Generating the two-dimensionally filtered pilot tone may use at least one least-mean-squares filter.


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