The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Jan. 05, 2016
Shanghai Jiaotong University, Shanghai, CN;
Neubrex Co., Ltd., Hyogo, JP;
Zuyuan He, Shanghai, CN;
Qingwen Liu, Shanghai, CN;
Xinyu Fan, Shanghai, CN;
Dian Chen, Shanghai, CN;
SHANGHAI JIAOTONG UNIVERSITY, Shanghai, CN;
NEUBREX CO., LTD., Hyogo, JP;
Abstract
Frequency synthesis-based optical frequency domain reflectometry method and system are disclosed. The method is to implement optical frequency reflectometry and comprises: performing an electro-optic modulation and an acousto-optic modulation on a local light to obtain an optical pulse; inputting the optical pulse as a detection pulse optical signal to a test optical fiber; and detecting an obtained Rayleigh backscattered optical signal under coherent detection with the local light, and then performing a photoelectric conversion and a demodulation, wherein: the electro-optic modulation is performed by using a single frequency signal; the acousto-optic modulation is performed by using a pulse signal; and the optical pulse is obtained by simultaneously sweeping multiple frequency components of an optical comb signal which is obtained by the electro-optic modulation.