The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
May. 11, 2015
Industry-university Cooperation Foundation Hanyang University, Seoul, KR;
Hanwha Precision Machinery Co., Ltd., Changwon-do, KR;
HyunJin Bang, Changwon-si, KR;
Cheolhyung Cho, Changwon-si, KR;
Kyungtaek Kim, Changwon-si, KR;
Deok-Soo Kim, Seoul, KR;
Kichun Lee, Seoul, KR;
Youngsong Cho, Seoul, KR;
Jae-Kwan Kim, Seoul, KR;
Industry-University Cooperation Foundation Hanyang University, Seoul, KR;
HANWHA PRECISION MACHINERY CO., LTD., Changwon-si, KR;
Abstract
A facility abnormality prediction model generation system includes: a data receiver receiving data of sensors of a facility previously obtained during an operation of the facility; an abnormality notification time predictor detecting a malfunction time of a malfunction of the facility based on the data of the sensors and determining an abnormality notification time for pre-notification of the malfunction of the facility based on the detected malfunction time; an optimal sensor combination calculator generating a chromosome based on the data of the sensors and performing a genetic algorithm using the generated chromosome to calculate an optimal sensor combination which is a combination of sensor data related to the determined abnormality notification time; and a facility abnormality prediction model generator generating a facility abnormality prediction model for the pre-notification of the malfunction of the facility, based on the optimal sensor combination.