The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Nov. 22, 2017
The Government of the United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);
John T. Sample, Pearl River, LA (US);
Elias Z. K. Ioup, New Orleans, LA (US);
Bruce Y. Lin, New Orleans, LA (US);
Norman Schoenhardt, New Orleans, LA (US);
Abstract
Embodiments relate to converting spatial features to a map projection. Initially, a map request that specifies the map projection for a geographic area is obtained. A spatial feature is identified for projecting into the map projection. Until a bisect threshold is satisfied for each line segment in the spatial feature, a bisect is determined for each of the line segments; each line segment is projected into the map projection; and if the bisect threshold is not satisfied for a line segment, the line segment is divided into subsegments, where the bisect threshold specifies an error distance for the line segment after projection. The modified spatial feature is projected into the map projection to obtain a projected spatial feature, and a polar coordinate system that corresponds to the map projection is used to render the projected spatial feature in a spatial map.