The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Oct. 11, 2011
Applicant:
Jason E. Lee, Collegeville, PA (US);
Inventor:
Jason E. Lee, Collegeville, PA (US);
Assignee:
LEIDOS INNOVATIONS TECHNOLOGY, INC., Gaithersburg, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01);
Abstract
Systems and methods (e.g., utilities) for use in providing automated data quality detection that can be used multiple times across various domains and across multiple data quality spheres. A data structure or schema of an incoming data set is initially mapped to a desired data or knowledge state in a domain ontology made up of a number of TBox statements. Data quality issues in the incoming data set can then be detected as instances of the incoming data set are attempted to be inferenced against or otherwise matched to anticipated TBox statements of the domain ontology.