The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Jul. 28, 2014
Applicant:

Sato Holdings Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kuniyuki Miura, Saitama, JP;

Masatoshi Takano, Saitama, JP;

Hideyuki Maeda, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/00 (2006.01); G06K 19/077 (2006.01); B65H 33/00 (2006.01); B65H 43/04 (2006.01); B26D 3/14 (2006.01); B26F 1/02 (2006.01); B26D 5/28 (2006.01); B65H 45/28 (2006.01); G06K 1/12 (2006.01);
U.S. Cl.
CPC ...
G06K 19/07718 (2013.01); B26D 3/14 (2013.01); B26D 5/28 (2013.01); B26F 1/02 (2013.01); B65H 33/00 (2013.01); B65H 43/04 (2013.01); B65H 45/28 (2013.01); G06K 1/121 (2013.01); B65H 2301/4214 (2013.01); B65H 2301/45 (2013.01); B65H 2301/5111 (2013.01); B65H 2301/5152 (2013.01); B65H 2553/52 (2013.01); B65H 2701/1113 (2013.01); B65H 2701/1242 (2013.01); B65H 2701/1244 (2013.01); B65H 2701/1942 (2013.01);
Abstract

To provide a marking device that enables to easily find a tag determined as defective (RFID error, etc.) among a plurality of tags that are stacked or the like. The marking device to use with a sheet includes cut and raising part for forming, as a failure process, a cut and raised section to be positioned at an edge of the sheet having been found the defect.


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