The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Oct. 31, 2017
Republic of Korea (National Forensic Service Director Ministry of Public Administration and Security), Seoul, KR;
Young Il Seo, Wonju-si, KR;
Sang Yoon Lee, Siheung-si, KR;
Eun Ah Joo, Yongin-si, KR;
Dong A Lim, Yuseong-gu, KR;
Jin Pyo Kim, Yuseong-gu, KR;
Nam Kyu Park, Bucheon-si, KR;
Abstract
Provided is a method of analyzing a tool trace, the method being performed by a tool trace analyzing apparatus including a camera unit and including obtaining a first image that is a three-dimensional (3D) image of the tool trace; displaying the first image on a screen; storing, in a database, second images that are 3D images of one or more tools and that correspond to a plurality of pieces of feature information of the one or more tools; when a specific tool is selected based on a user input, searching for a second image from among the second images in the database, the second image corresponding to the specific tool, and displaying the second image on the screen; matching the second image with the first image and thus generating a match image; and displaying the match image on the screen.