The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Jun. 30, 2016
Applicant:

Facebook, Inc., Menlo Park, CA (US);

Inventors:

Szymon Piechowicz, San Mareo, CA (US);

Barak Reuven Naveh, Palo Alto, CA (US);

Annie Hsin-Wen Liu, Fremont, CA (US);

Ashish Gupta, Mountain View, CA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 16/901 (2019.01); G06F 16/28 (2019.01); G06Q 10/04 (2012.01); G06Q 50/00 (2012.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01); G06F 16/285 (2019.01); G06Q 10/04 (2013.01); G06Q 50/01 (2013.01);
Abstract

Various embodiments include a classification platform system. A user can define a classification experiment on the classification platform system. For example, the user can define an input data space by selecting at least one of data sources interfaced with the classification platform system and defining a workflow configuration including a directed graph (DG) connecting a plurality of transformation blocks to represent an experiment workflow. The DG can specify how one or more outputs of each of the transformation blocks are fed into one or more other transformation blocks. The DG can be defined graphically. The classification platform system can schedule the experiment workflow to be executed on a distributed computation platform according to the input data space and the workflow configuration.


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