The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Jun. 23, 2017
Applicant:

Quantum Corporation, San Jose, CA (US);

Inventor:

John Reinart, Roseville, MN (US);

Assignee:

Quantum Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); H03M 13/37 (2006.01); G06F 11/10 (2006.01); H03M 13/15 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 11/1076 (2013.01); H03M 13/154 (2013.01); H03M 13/373 (2013.01); H03M 13/3761 (2013.01); G06F 3/064 (2013.01);
Abstract

Example apparatus and methods monitor conditions in an object storage system. The conditions monitored may include a load balance measure in the system, a capacity balance measure in the system, a fault tolerance measure in the system, or a usage pattern measure in the system. A distribution plan or redistribution plan for storing or moving erasure codes in the object storage system may be determined based on the conditions. The distribution plan or the redistribution plan for the erasure codes may be updated dynamically in response to changing conditions in the object storage system. The distribution or redistribution may depend on a weighted combination of the load balance measure, the capacity balance measure, the fault tolerance measure, or the usage pattern measure so that responding to one sub-optimal condition (e.g., load imbalance) does not create a different sub-optimal condition (e.g., unacceptable fault tolerance).


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