The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Sep. 27, 2017
Western Digital Technologies, Inc., San Jose, CA (US);
Gautam Ashok Dusija, Burlingame, CA (US);
Venkatesh Prasa Ramachandra, San Jose, CA (US);
Mrinal Kochar, San Jose, CA (US);
WESTERN DIGITAL TECHNOLOGIES, INC., San Jose, CA (US);
Abstract
The present disclosure, in various embodiments, describes technologies and techniques for detecting errors in a non-volatile memory (NVM) device prior to performing re-training/recalibration. A processing device in a NVM controller detects a cyclic redundancy check (CRC) condition for detecting error in the NVM device, and a re-training condition that is based on the CRC condition. A CRC circuit generates CRC code when a CRC condition is detected, and the processing is configured to compare CRC code received from the NVM controller with the generated CRC code to detect error. A calibration circuit then re-trains the NVM device if the CRC circuit detects error and the re-training condition has been met.