The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Oct. 19, 2015
Rodenstock Gmbh, München, DE;
Rüdiger Scherschlicht, Unterhaching, DE;
Michael Vögt, Gilching, DE;
RODENSTOCK GMBH, München, DE;
Abstract
A layer system includes at least one stack of successive multilayers, wherein each multilayer includes a first partial layer with a first optical thickness and a second partial layer with a second optical thickness that is different from the first optical thickness. The multilayer has optical characteristics that are specified depending on a parameter which is a function of a ratio of quotients of the optical thickness of a partial layer with higher refractive characteristics and the optical thickness of a partial layer with lower refractive characteristics of the respective multilayers, wherein the index i denotes the order of the successive multilayers in the stack. The product of a reflectivity of the stack of multilayers and the parameter is less than for an anti-reflection and/or anti-reflective effect of the stack of multilayers, or is greater than or equal to 1 for a mirroring. An optical element may include a layer system and a method for producing such a layer system.