The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
May. 23, 2015
Radiabeam Technologies, Llc, Santa Monica, CA (US);
Anatoli Arodzero, Billerica, MA (US);
Salime Max Boucher, Santa Monica, CA (US);
Alex Murokh, Encino, CA (US);
Sergey Vinogradov, Warrington, GB;
Sergey Kutsaev, Santa Monica, CA (US);
RadiaBeam Technologies, LLC, Santa Monica, CA (US);
Abstract
An X-ray based inspection systems providing radiographic imaging for cargo inspection and material discrimination with adaptive control dependent upon characteristics of the cargo under inspection. A packet of X-ray pulses with controllable packet duration is produced that allows multi-energy material discrimination in a single scan line and real-time adjustment of packet duration to adapt to cargo attenuation. In addition, adaptive dynamic adjustment of the operational characteristic of the detector channels increases the effective dynamic range and as a result increases the penetration and range of thicknesses where material discrimination is possible. The material discrimination technique is applied within a single packet of short pulses of several hundred nanoseconds. Feedback from the detection system is used to control the packet duration of each packet of X-ray pulses in order to adapt scan parameters to the object that is being imaged.