The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Oct. 21, 2014
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Tilman Gloekler, Gaertringen, DE;

Andreas Koenig, Boeblingen, DE;

Jens Kuenzer, Böblingen, DE;

Cedric Lichtenau, Stuttgart, DE;

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318563 (2013.01); G01R 31/318544 (2013.01);
Abstract

The invention relates to an electronic circuit () having one or more latch scan chains (), the electronic circuit () comprising (i) a built-in test structure (); (ii) generation means () for simultaneously generating scan-in data for each of said scan chains (); (iii) interception means () for simultaneously intercepting test lines () of said scan chains (), said test lines () comprising scan-in lines () and/or control lines (). Said interception means () are responsive to said generation means () in order to simultaneously feed the generated scan-in data into each of said scan chains () for initializing the electronic circuit (). The invention further relates to a method for initializing an electronic circuit (), as well as a data processing system () for initializing an electronic circuit ().


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