The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Sep. 16, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
Gregory Steven Lee, Mountain View, CA (US);
Christopher L. Coleman, San Jose, CA (US);
Gregory Douglas VanWiggeren, San Jose, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
Various illustrative embodiments disclosed herein generally pertain to detecting defects by using a radio-frequency debugging signal transmitted by a transmitting antenna array towards a receiving antenna located in a far-field region of the transmitting antenna array. The radio-frequency debugging signal, which is configured to provide information pertaining to a signal radiation distribution of the transmitting antenna array, is received in the receiving antenna and conveyed to a test unit. The test unit digitizes the received radio-frequency debugging signal to obtain a digital dataset and applies a back-propagation algorithm to the digital dataset for deriving a reconstructed near-field representation of the transmitting array. The reconstructed near-field representation is compared to a signal radiation reference template in order to detect a defective amplitude and/or a defective phase that is indicative of a defect in the transmitting antenna array and/or a device-under-test coupled to the transmitting antenna array.