The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Feb. 02, 2018
Applicant:
Tera-print, Llc, Evansville, IN (US);
Inventors:
Andrey Ivankin, Chicago, IL (US);
Jared A. Magoline, Fond du Lac, WI (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 80/00 (2010.01); G01Q 70/14 (2010.01); G01Q 10/04 (2010.01); G03F 7/00 (2006.01); G01Q 70/06 (2010.01);
U.S. Cl.
CPC ...
G01Q 80/00 (2013.01); G01Q 10/04 (2013.01); G01Q 70/14 (2013.01); G03F 7/0002 (2013.01); G01Q 70/06 (2013.01);
Abstract
Disclosed embodiments provide an electrical contact alignment strategy for leveling an array of probes, pens, tips, etc., in relationship to a substrate, for example, wherein a plurality of independent electrical circuits are formed by configuring regions of the array and substrate regions to be partially conductive and connected to opposite electrodes or vice versa.
Quick Actions:
Ivankin, Andrey. (2019). Electrical contact auto-alignment strategy for highly parallel pen arrays in cantilever free scanning probe lithography (U.S. Patent No. 10459004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10459004
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile