The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Jun. 14, 2017
Applicant:
Leidos, Inc., Reston, VA (US);
Inventors:
Rex David Richardson, Poway, CA (US);
William L. Hicks, Escondido, CA (US);
Mark Alan Peressini, San Diego, CA (US);
Assignee:
Leidos, Inc., Reston, VA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/22 (2018.01);
U.S. Cl.
CPC ...
G01N 23/22 (2013.01); G01N 2223/407 (2013.01); G01N 2223/5015 (2013.01);
Abstract
A scan head design uses 1:1 (one-to-one) imaging micro-lens arrays to transfer the object plane X-ray image from a CR-plate onto a linear photosensor. The scan-head includes a housing having therein, an array of red light emitting diodes (LEDs), a red-absorbing filter, a microlens array, an infrared-filter, and a sensor. The housing faces the CR-plate and the scan-head is translated across the CR-plate to read out the X-ray image therein. The scan head is compact and provides for improved spatial resolution and reduced power requirements.