The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Feb. 02, 2017
Applicant:

Gemmacert Ltd., Ra'anana, IL;

Inventors:

Dana Yarden, Tel Aviv, IL;

Oded Shoseyov, Shoham, IL;

Merav Blanca, Modiin, IL;

Assignee:

Gemmacert Ltd., Ra'anana, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/359 (2014.01); G01N 33/00 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/359 (2013.01); G01N 21/65 (2013.01); G01N 33/0098 (2013.01); G01N 2201/129 (2013.01);
Abstract

System and methods may qualify plant material. A system for qualifying plant material may include an inspection zone, a support stage configured to support the plant material in the inspection zone, at least one camera configured to acquire at least one image of the plant material in the inspection zone, at least one processor configured to receive and analyze the camera image to identify a region of interest containing specific plant structures possessing active component, and at least one spectrometer configured to acquire a spectrometric measurement of the plant material in the inspection zone. The at least one processor may be further configured to facilitate a spectrometric measurement of the specific plant structures identified in the camera image, and to enable output of an indicator of a quality measure of the plant material based on the spectrometric measurement of the specific plant structures identified in the camera image.


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