The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Oct. 31, 2014
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Philip D. Nguyen, Houston, TX (US);

Jesse Clay Hampton, Conroe, TX (US);

Douglas Everett Wyatt, Kingwood, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01N 29/14 (2006.01); G01N 29/44 (2006.01); G01V 1/28 (2006.01); E21B 43/26 (2006.01);
U.S. Cl.
CPC ...
E21B 49/006 (2013.01); E21B 43/26 (2013.01); E21B 49/00 (2013.01); G01N 29/14 (2013.01); G01N 29/4472 (2013.01); G01V 1/284 (2013.01); G01V 1/288 (2013.01); G01V 2210/123 (2013.01); G01V 2210/1234 (2013.01); G01V 2210/65 (2013.01);
Abstract

A method can include receiving acoustic emission data for acoustic emissions originating in a formation, performing a moment tensor analysis of the data, thereby yielding acoustic emission source parameters, determining at least one acoustic emission source parameter angle having a highest number of associated acoustic emission events, and calculating an in situ stress parameter, based on the acoustic emission source parameter angle. A system can include multiple sensors that sense acoustic emissions originating in a formation, and a computer including a computer readable medium having instructions that cause a processor to perform a moment tensor analysis of the data and yield acoustic emission source parameters, determine at least one acoustic emission source parameter angle having a highest number of associated acoustic emission events, and calculate an in situ stress parameter, based on the acoustic emission source parameter angle.


Find Patent Forward Citations

Loading…