The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Feb. 12, 2016
Samsung Electronics Co., Ltd., Suwon-si, KR;
Iucf-hyu (Industry-university Cooperation Foundation Hanyang University), Seoul, KR;
Sangkyu Kim, Yongin-si, KR;
Jungmok Bae, Seoul, KR;
Joonhyung Lee, Yongin-si, KR;
Hyeseon Lee, Pohang-si, KR;
Hoeil Chung, Seoul, KR;
Junghye Lee, Ulsan, KR;
Kyeol Chang, Seoul, KR;
Seongho Cho, Gwacheon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY), Seongdong-Gu, Seoul, KR;
Abstract
A method and device for measuring a biological variable are provided. The method of measuring the biological variable may include detecting an infrared signal which is irradiated toward a body part and is reflected therefrom, extracting spectrum data from the detected infrared signal, obtaining intensity data corresponding to a preset frequency from the extracted spectrum data, obtaining a biological information-measuring model by performing multiple linear regression (MLR) on the obtained data, and measuring a biological signal of the body part by using the obtained biological information-measuring model.