The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2019

Filed:

Feb. 22, 2016
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, JP;

Inventors:

Yasufumi Fukuma, Wako, JP;

Kazuhiro Oomori, Setagaya-ku, JP;

Satoshi Yamamoto, Saitama, JP;

Assignee:

KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/13 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61B 3/132 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61F 9/008 (2013.01); A61F 9/00821 (2013.01); A61F 2009/00851 (2013.01);
Abstract

According to one embodiment, an ophthalmic microscope system includes an illumination system, a pair of light-receiving systems, and an irradiation system. The illumination system is configured to irradiate a subject's eye with illumination light. Each of the light-receiving systems includes a first objective lens and a first imaging device, and is configured to guide the illumination light returning from the subject's eye to the first imaging device through the first objective lens. The objective optical axes of the light-receiving systems are not parallel to each other. The irradiation system is configured to irradiate the subject's eye with light different from the illumination light from a direction different from the objective optical axes.


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