The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Jun. 28, 2013
Applicant:

Infinera Corp., Annapolis Junction, MD (US);

Inventors:

Satyajeet Ahuja, Cupertino, CA (US);

Ping Pan, San Jose, CA (US);

Rajan Rao, Fremont, CA (US);

Biao Lu, Saratoga, CA (US);

Assignee:

Infinera Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01); H04L 12/26 (2006.01); H04L 12/56 (2006.01); H04B 7/212 (2006.01); H04Q 11/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 11/0066 (2013.01);
Abstract

A method, comprises measuring, by circuitry of a computer system, a first bandwidth of data traffic of a transport path over a time period, the transport path passing through a plurality of nodes and conforming to a protocol using a number of time slots to allocate a second bandwidth to the transport path. The method further includes passing a signal, from the computer system to at least one of the nodes of the transport path, the signal including at least one instruction that when executed by circuitry of the at least one node causes a change to the number of time slots allocated to the transport path.


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