The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Apr. 13, 2017
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Martin Leibfritz, Aying, DE;
Werner Held, Pocking, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2015.01); H04B 17/364 (2015.01); H04L 27/02 (2006.01); H04L 27/00 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
H04B 17/364 (2015.01); H04L 27/0008 (2013.01); H04L 27/02 (2013.01); G01R 27/28 (2013.01);
Abstract
A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.