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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10453891 B1

PDFFull Text
Date of Patent:
Oct. 22, 2019

Filed:

Aug. 01, 2017

Substrate with conductive film

Applicant:

Agc Inc., Chiyoda-ku, JP;

Inventors:

Takeshi Tomizawa, Chiyoda-ku, JP;

Yuki Aoshima, Chiyoda-ku, JP;

Reo Usui, Chiyoda-ku, JP;

Hidefumi Odaka, Chiyoda-ku, JP;

Assignee:

AGC Inc., Chiyoda-ku, JP;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Charles D Garber

Assistant Examiner:

Xiaoming Liu

Int. Cl.
CPC ...
H01L 27/146 (2006.01); B32B 7/02 (2019.01); B32B 9/00 (2006.01); H01B 5/14 (2006.01); H05K 1/02 (2006.01); H01L 51/00 (2006.01); C01G 9/02 (2006.01); C01G 15/00 (2006.01); C01G 19/02 (2006.01); C08F 14/26 (2006.01); C08G 63/183 (2006.01); C08G 64/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14696 (2013.01); B32B 7/02 (2013.01); B32B 9/00 (2013.01); H01B 5/14 (2013.01); H01L 51/0021 (2013.01); H05K 1/02 (2013.01); C01G 9/02 (2013.01); C01G 15/00 (2013.01); C01G 19/02 (2013.01); C08F 14/26 (2013.01); C08G 63/183 (2013.01); C08G 64/02 (2013.01); H01L 2251/306 (2013.01);
Abstract

A substrate with conductive film includes a base material; and a film of a conductive metal oxide arranged on an upper part of the base material. The film includes, by a top plan view, a first region and a second region, the second region is configured of a same material as the first region, and an electric resistance of the second region is higher than an electric resistance of the first region. The second region includes a part configured by a plurality of cellular sections surrounded by a plurality of fine cracks. In the part, each fine crack has a width of 1 nm to 50 nm, and each cellular section has a largest measure of less than 10 μm.

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