The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Nov. 15, 2017
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventor:

Qiang Tang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 53/00 (2006.01); H01L 21/321 (2006.01); B24B 47/12 (2006.01); B24B 49/04 (2006.01); C09G 1/02 (2006.01); B24B 37/24 (2012.01); B24B 53/017 (2012.01); B24B 37/04 (2012.01); B24D 13/14 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3212 (2013.01); B24B 37/24 (2013.01); B24B 47/12 (2013.01); B24B 49/04 (2013.01); B24B 53/017 (2013.01); C09G 1/02 (2013.01); B24B 37/042 (2013.01); B24D 13/147 (2013.01);
Abstract

The present disclosure describes a chemical mechanical polishing device and a chemical mechanical polishing method. The chemical mechanical polishing device includes: a cleaning apparatus and a polishing pad conditioner disc positionally configurable relative to the cleaning apparatus, where the cleaning apparatus includes: a cleaning disc; a pre-polishing pad disposed inside the cleaning disc and configured to perform a pre-polishing operation of the polishing pad conditioner disc when positioned in contact with the polishing pad conditioner disc; a pre-polishing grinding liquid dispensing assembly disposed on a side edge of the cleaning disc and configured to supply a pre-polishing grinding liquid to the pre-polishing pad; and a rotation driver configured to drive the pre-polishing pad to rotate during the pre-polishing operation. The present disclosure beneficially reduces wafer scratches and increases evenness of distribution of a grinding liquid during polishing.


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