The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
May. 15, 2018
Applicant:
Seagate Technology Llc, Cupertino, CA (US);
Inventors:
Victor Sapozhnikov, Minnetonka, MN (US);
Mohammed Shariat Ullah Patwari, Edina, MN (US);
Jason B Gadbois, Shakopee, MN (US);
Taras Grigorievich Pokhil, Arden Hills, MN (US);
Assignee:
SEAGATE TECHNOLOGY LLC, Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/31 (2006.01); G11B 5/265 (2006.01); G11B 5/02 (2006.01); G11B 5/29 (2006.01); G11B 5/455 (2006.01); G11B 5/39 (2006.01);
U.S. Cl.
CPC ...
G11B 5/265 (2013.01); G11B 5/02 (2013.01); G11B 5/2651 (2013.01); G11B 5/29 (2013.01); G11B 5/3116 (2013.01); G11B 5/3173 (2013.01); G11B 5/3189 (2013.01); G11B 5/3948 (2013.01); G11B 5/3951 (2013.01); G11B 5/3958 (2013.01); G11B 5/455 (2013.01);
Abstract
A method of forming a read head. The method includes forming first and second read sensors. A first read measurement is performed on a storage medium using the first read sensor. A second read measurement is performed on the storage medium using the second read sensor. Based on a comparison of the first and second read measurements to a predetermined quantity, either the first read sensor or the second read sensor is selected to be operational in a data storage device.