The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Aug. 18, 2017
Optrascan, Inc., Cupertino, CA (US);
Abhijeet Gholap, Cupertino, CA (US);
Anagha Jadhav, Sunnyvale, CA (US);
Isha Doshi, Sunnyvale, CA (US);
Gurunath Kamble, Sunnyvale, CA (US);
OptraScan, Inc., Cupertino, CA (US);
Abstract
A tissue area detection method in digital pathology imaging uses an automated method to detect tissue area of interest (AOI detection) on a Whole Slide Analysis (WSA) or Tissue Micro Array (TMA) thumbnail image. The present method may use preprocessing of the image followed by a two-pass segmentation technique for separating tissue areas from non-tissue areas. The present method may further use global and local window statistics for thresholding to overcome variations in staining intensity that may hamper accurate selection of the area of interest. The present method may also have a classifying process of the tissue area based on the staining method used and applying stain specific filters to remove unwanted artifacts.