The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

May. 13, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yea Jane Chu, Chicago, IL (US);

Sier Han, Xi'an, CN;

Jing-Yun Shyr, Naperville, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/063 (2013.01); G06T 11/206 (2013.01);
Abstract

Techniques are described for generating characterizations of time series data. In one example, a method includes extracting a trend-cycle component, a seasonal component, and an irregular component from a time series of data. The method further includes performing one or more pattern analyses on the trend-cycle component, the seasonal component, and the irregular component. The method further includes, for each pattern analysis of the one or more pattern analyses, performing a comparison of an analytic result of the respective pattern analysis to a selected significance threshold for the respective pattern analysis to determine if the analytic result passes the significance threshold for the respective pattern analysis. The method further includes generating an output for each of the analytic results that pass the significance threshold for the respective pattern analysis.


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