The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Nov. 11, 2014
Applicant:
Amazon Technologies, Inc., Reno, NV (US);
Inventors:
Polly Po Yee Lee, Seattle, WA (US);
Nicolle M. Correa, Seattle, WA (US);
Leo Parker Dirac, Seattle, WA (US);
Aleksandr Mikhaylovich Ingerman, Seattle, WA (US);
Assignee:
Amazon Technologies, Inc., Reno, NV (US);
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01); G09B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G09B 5/00 (2013.01); G06N 5/04 (2013.01);
Abstract
A first data set corresponding to an evaluation run of a model is generated at a machine learning service for display via an interactive interface. The data set includes a prediction quality metric. A target value of an interpretation threshold associated with the model is determined based on a detection of a particular client's interaction with the interface. An indication of a change to the prediction quality metric that results from the selection of the target value may be initiated.