The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Mar. 17, 2014
Applicant:

Riken, Wako-shi, Saitama, JP;

Inventors:

Song-Ju Kim, Saitama, JP;

Masashi Aono, Saitama, JP;

Etsushi Nameda, Saitama, JP;

Masahiko Hara, Saitama, JP;

Assignee:

RIKEN, Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06Q 10/04 (2012.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06Q 10/04 (2013.01);
Abstract

A solution search system, which can search for a test object, expected to output an optimal result, from at least two test objects each outputting a result based on a probability distribution, includes: a record superiority comparing unit which can obtain past records of the test objects based on an accumulation of the output results and can compare all records for superiority/inferiority; a controlling unit which can control a measurement variable of the test objects, based on the compared superiority/inferiority records, and a latest result output from the test object; and an output instructing unit which can instruct the test object, the measurement variable of which has exceeded a threshold value, to output a result, wherein the output instructing unit determines, as a desired solution, at least one test object to which the largest number of the output instructions have finally been given after repetition of the output instructions.


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