The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Dec. 15, 2016
Applicant:
Goodrich Corporation, Charlotte, NC (US);
Inventors:
Edgar A. Bernal, Webster, NY (US);
Kishore K. Reddy, Vernon, CT (US);
Michael J. Giering, Bolton, CT (US);
Assignee:
Goodrich Corporation, Charlotte, NC (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/03 (2006.01); H04N 5/232 (2006.01); H04N 19/103 (2014.01); H04N 19/426 (2014.01); G06N 5/02 (2006.01); G06K 9/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6203 (2013.01); G06K 9/0063 (2013.01); G06K 9/03 (2013.01); G06K 9/3233 (2013.01); G06K 9/6256 (2013.01); G06K 9/6267 (2013.01); G06N 5/02 (2013.01); H04N 5/23296 (2013.01); H04N 19/103 (2014.11); H04N 19/426 (2014.11);
Abstract
An imaging method includes obtaining an image with a first field of view and first effective resolution and the analyzing the image with a visual attention algorithm to one identify one or more areas of interest in the first field of view. A subsequent image is then obtained for each area of interest with a second field of view and a second effective resolution, the second field of view being smaller than the first field of view and the second effective resolution being greater than the first effective resolution.