The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Nov. 14, 2017
Applicant:
Cognitech, Inc., Pasadena, CA (US);
Inventors:
Assignee:
Cognitech, Inc., Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); H04N 1/00 (2006.01); G06T 7/80 (2017.01); G01B 11/24 (2006.01); G01B 11/27 (2006.01); G06T 7/60 (2017.01); H04N 5/225 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00973 (2013.01); G01B 11/24 (2013.01); G01B 11/27 (2013.01); G06K 9/00 (2013.01); G06T 5/006 (2013.01); G06T 7/60 (2013.01); G06T 7/80 (2017.01); H04N 1/00336 (2013.01); H04N 5/225 (2013.01); G06K 2009/363 (2013.01); G06K 2209/40 (2013.01);
Abstract
Detecting a pattern in an image by receiving the image of a pattern and storing the image in a memory, where the pattern is composed of shapes that have geometrical properties that are invariant under near projective transforms. In some embodiments the process detects shapes in the image using the geometrical properties of the shapes, determines the alignment of the various shapes, and, corresponds or matches the shapes in the image with the shapes in the pattern. This pattern detection process may be used for calibration or distortion correction in optical devices.