The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Aug. 24, 2015
Applicant:

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Kyung Ho Lee, Seoul, KR;

Young In You, Seoul, KR;

Seon Ju Kim, Seoul, KR;

In Hyun Cho, Seoul, KR;

Hyun Sik Yoon, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/57 (2013.01); G06F 2221/034 (2013.01);
Abstract

A method for measurement of an information-security-controlling status in accordance with the present disclosure includes receiving actual inspection data obtained by actually inspecting whether each domain complies with each security-controlling item, computing security-controlling status measurement scores for each domain on the basis of a significance grade of each control item, the degree of compliance with a corresponding control item, and a weighting set by a measurement manager, computing a final security-controlling status measurement score for a parent organization to which each domain belongs on the basis of an average of the security-controlling status measurement scores for each domain, and outputting the computed security-controlling status measurement scores and final security-controlling status measurement score.


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