The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Dec. 09, 2016
Applicant:

Symantec Corporation, Mountain View, CA (US);

Inventors:

Ryan Curtin, Atlanta, GA (US);

Aleatha Parker-Wood, Palo Alto, CA (US);

Reuben Feinman, Mountain View, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/55 (2013.01); G06N 20/00 (2019.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 21/55 (2013.01); G06N 20/00 (2019.01); G06K 9/6256 (2013.01);
Abstract

A method for improving cascade classifier ordering is described. In one embodiment, the method may include determining an efficacy rating of a first current configuration, generating a decreasing sequence of values for a control parameter, and selecting a current value of the control parameter according to the decreasing sequence of values. In some cases, the method may include randomly selecting a first test configuration among the plurality of configurations based at least in part on the current value of the control parameter, analyzing the first test configuration in relation to the first current configuration, and implementing, based at least in part on the analyzing of the first test configuration, the first test configuration in a machine learning classification system of a computing device to improve a data classification accuracy of the computing device.


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