The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Apr. 08, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rajiv V. Joshi, Yorktown Heights, NY (US);

Yefim Shuf, Franklin Square, NY (US);

Jonathan Sloan, Manalapan, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 17/5036 (2013.01); G06N 5/045 (2013.01);
Abstract

In one example, a method for evaluating a system includes obtaining a model of the system that defines a boundary between at least one failure region and a non-failure region for a performance indicator with respect to at least one variable of the system. In one embodiment, obtaining the model involves constructing a new model; however, in other embodiments, obtaining the model involves accepting or retrieving a pre-constructed model is input. The method further includes obtaining importance samples for the at least one variable that are biased to the at least one failure region, and calculating indicator values for the performance indicator by applying the importance samples to the model.


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