The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Dec. 23, 2014
Applicant:

Teradata Us, Inc., Dayton, OH (US);

Inventors:

Kuorong Chiang, Buena Park, CA (US);

Chuchu Wu, Los Angeles, CA (US);

Wei Tang, Rancho Palos Verdes, CA (US);

Assignee:

Teradata US, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24539 (2019.01); G06F 16/24545 (2019.01);
Abstract

Query conditions are received in a cache from a query optimizer of a Database Management System (DBMS). Dynamic statistics for the query conditions are maintained in the cache. Actual statistics are received in the cache after the query conditions are executed in the DBMS. Entropy-based estimated selectivity values for executing the query conditions are provided to the query optimizer to develop a query plan for executing queries having the query conditions. The entropy-based estimated selectivity values based, at least in part, on the dynamic statistics and the actual statistics.


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