The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Dec. 18, 2017
Apkudo, Llc, Baltimore, MD (US);
Joshua Scott Matthews, Baltimore, MD (US);
David Michael Teitelbaum, Havre de Grace, MD (US);
Apkudo, LLC, Baltimore, MD (US);
Abstract
Systems and methods for facilitating field testing of a test application are provided. In certain implementations, one or more metrics related to execution, at a user device, of one or more operations of the test application may be obtained. A determination of whether an error occurred with an operation of the one or more operations may be effectuated based on the one or more metrics. Error information relating to the error may be caused to be transmitted to one or more other user devices, wherein the error information includes information for replicating the error. Replication information relating to an attempt by the first other user device to replicate the error may be received back from at least a first other user device of the one or more other user devices. A determination of whether the first other user device replicated the error may be effectuated based on the replication information.