The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Nov. 25, 2014
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Klaus Haeuptle, Bad Shoenborn, DE;

Kay Hammerl, Sankt Leon-Rot, DE;

Nena Raab, Heidelberg, DE;

Christian Edward Swanepoel, Neckarsteinach, DE;

Klaus Ziegler, Neidenstein, DE;

Jens Keller, Sankt Leon-Rot, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3672 (2013.01); G06F 11/3684 (2013.01);
Abstract

Various embodiments of systems and methods to provide a testing framework for testing code are described herein. In one aspect, a request to test at least a portion of code is received. A test model composed of model elements representing the portion of the code, code on which the portion of the code depends and one or more preexisting test doubles is generated. An option is provided to define one or more test double elements, in the test model, corresponding to the code on which the portion of the code depends. Further, an option is provided to alter dependencies between the model elements and the defined one or more test double elements in the test model. Furthermore, new one or more code artefacts are generated based on the test model and the generated new one or more code artefacts are executed to test logic of the portion of the code.


Find Patent Forward Citations

Loading…